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dc.contributor.author
Zougrou, I.M.  
dc.contributor.author
Katsikini, M.  
dc.contributor.author
Pinakidou, F.  
dc.contributor.author
Brzhezinskaya, M.  
dc.contributor.author
Papadopoulou, L.  
dc.contributor.author
Vlachos, Evangelos  
dc.contributor.author
Tsoukala, E.  
dc.contributor.author
Paloura, E.C.  
dc.date.available
2020-09-25T14:03:44Z  
dc.date.issued
2016-08  
dc.identifier.citation
Zougrou, I.M.; Katsikini, M.; Pinakidou, F.; Brzhezinskaya, M.; Papadopoulou, L.; et al.; Characterization of fossil remains using XRF, XPS and XAFS spectroscopies; IOP Publishing; Journal of Physics: Conference Series; 712; 1; 8-2016; 1-5  
dc.identifier.issn
1742-6588  
dc.identifier.uri
http://hdl.handle.net/11336/114827  
dc.description.abstract
Synchrotron radiation micro-X-Ray Fluorescence (m-XRF), X-ray photoelectron (XPS) and X-ray Absorption Fine Structure (XAFS) spectroscopies are applied for the study of paleontological findings. More specifically the costal plate of a gigantic terrestrial turtle Titanochelon bacharidisi and a fossilized coprolite of the cave spotted hyena Crocuta crocuta spelaea are studied. Ca L2,3-edge NEXAFS and Ca 2p XPS are applied for the identification and quantification of apatite and Ca containing minerals. XRF mapping and XAFS are employed for the study of the spatial distribution and speciation of the minerals related to the deposition environment.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
IOP Publishing  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by/2.5/ar/  
dc.subject
XRF  
dc.subject
XPS  
dc.subject
XAFS  
dc.subject
TESTUDINIDAE  
dc.subject
FOSSIL  
dc.subject
DEPOSITION ENVIRONMENT  
dc.subject.classification
Física de Partículas y Campos  
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Ciencias Físicas  
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CIENCIAS NATURALES Y EXACTAS  
dc.subject.classification
Paleontología  
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Ciencias de la Tierra y relacionadas con el Medio Ambiente  
dc.subject.classification
CIENCIAS NATURALES Y EXACTAS  
dc.title
Characterization of fossil remains using XRF, XPS and XAFS spectroscopies  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2020-09-24T17:29:52Z  
dc.identifier.eissn
1742-6596  
dc.journal.volume
712  
dc.journal.number
1  
dc.journal.pagination
1-5  
dc.journal.pais
Reino Unido  
dc.description.fil
Fil: Zougrou, I.M.. Aristotle University of Thessalonik; Grecia  
dc.description.fil
Fil: Katsikini, M.. Aristotle University of Thessalonik; Grecia  
dc.description.fil
Fil: Pinakidou, F.. Aristotle University of Thessalonik; Grecia  
dc.description.fil
Fil: Brzhezinskaya, M.. No especifíca;  
dc.description.fil
Fil: Papadopoulou, L.. Aristotle University of Thessalonik; Grecia  
dc.description.fil
Fil: Vlachos, Evangelos. Aristotle University of Thessalonik; Grecia. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Tsoukala, E.. Aristotle University of Thessalonik; Grecia  
dc.description.fil
Fil: Paloura, E.C.. Aristotle University of Thessalonik; Grecia  
dc.journal.title
Journal of Physics: Conference Series  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://iopscience.iop.org/article/10.1088/1742-6596/712/1/012090  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1088/1742-6596/712/1/012090  

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