Artículo
Improved spectral resolution in time-varying interferometry
Antonacci, Julian; Morel, Eneas Nicolas
; Torga, Jorge Román
; Duchowicz, Ricardo
; Arenas, Gustavo Francisco
Fecha de publicación:
11/2018
Editorial:
Elsevier
Revista:
Optics And Lasers In Engineering
ISSN:
0143-8166
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
In this work, we present a procedure that allows increasing the resolution of dynamic length measurements made by spectral interferometry. The proposed scheme leads to obtaining a compact photonic instrument with the ability to measure distances, variations on positions and vibrations with a very high resolution. This measurement system includes a superluminescent source (SLED), a digital spectrometer and a Fizeau interferometer. Spectral data is processed by applying Fourier domain techniques previously applied in optical coherence tomography. The resolution of the spectral measurement system is determined by the spectrometer bandwidth and the light source employed. A signal is obtained by analysing the time evolution of a single pixel from the spectrometer CCD sensor, which is later analysed using time domain interferometry (TDI) techniques. This procedure works by detecting changes in the optical path below those that can be detected by spectral analysis. The original resolution obtained with the solely spectral techniques was 2.2 µm but was improved to 40 nm by complementary analysis of temporal signals.
Palabras clave:
Interferometry
,
Superluminiscent diodes
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Articulos(CIOP)
Articulos de CENTRO DE INVEST.OPTICAS (I)
Articulos de CENTRO DE INVEST.OPTICAS (I)
Articulos(ICYTE)
Articulos de INSTITUTO DE INVESTIGACIONES CIENTIFICAS Y TECNOLOGICAS EN ELECTRONICA
Articulos de INSTITUTO DE INVESTIGACIONES CIENTIFICAS Y TECNOLOGICAS EN ELECTRONICA
Articulos(SEDE CENTRAL)
Articulos de SEDE CENTRAL
Articulos de SEDE CENTRAL
Citación
Antonacci, Julian; Morel, Eneas Nicolas; Torga, Jorge Román; Duchowicz, Ricardo; Arenas, Gustavo Francisco; Improved spectral resolution in time-varying interferometry; Elsevier; Optics And Lasers In Engineering; 110; 11-2018; 457-461
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