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dc.contributor.author
Li, Y.
dc.contributor.author
Hällström, J.
dc.contributor.author
Larzelere, W.
dc.contributor.author
Bergman, A.
dc.contributor.author
Rickmann, J.
dc.contributor.author
Hauschild, W.
dc.contributor.author
Diaz, Ricardo Ruben
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Garnacho, F.
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McComb, T.
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Okabe, S.
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Zhang, Y. X.
dc.contributor.author
Elg, Alf Peter
dc.date.available
2016-08-22T14:32:57Z
dc.date.issued
2014-08
dc.identifier.citation
Li, Y.; Hällström, J.; Larzelere, W.; Bergman, A.; Rickmann, J.; et al.; Past, Present and Future of IEC and IEEE High-Voltage Testing Standards; International Council on Large Electric Systems; Electra; 276; 8-2014; 65-71
dc.identifier.issn
1519-793X
dc.identifier.uri
http://hdl.handle.net/11336/7261
dc.description.abstract
Recently, IEC and IEEE have published a number of revised and new standards for high-voltage and high-current testing. These standards include IEC 60060 1:2010, IEC 60060 2:2010, IEC 61083 2:2013, IEC 62475:2010 and IEEE Std.4 2013. Significant changes and additions have been introduced to these revised and new standards. Many members of CIGRE WG D1.35 were involved in the revision and development of these standards as members of IEC TC 42 and IEEE PSIM Subcommittee HVTT, particularly in the development of the new techniques and new procedures that are now adopted in the standards. This Guide has been written by members of CIGRE WG D1.35 to give high-voltage test engineers a broader knowledge of how to apply the latest high-voltage and high-current testing standards.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
International Council on Large Electric Systems
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
High Voltage
dc.subject
High Current
dc.subject
Measurement
dc.subject
Standard
dc.subject.classification
Ingeniería Eléctrica y Electrónica
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dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información
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dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS
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dc.title
Past, Present and Future of IEC and IEEE High-Voltage Testing Standards
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2016-08-17T15:40:09Z
dc.journal.volume
276
dc.journal.pagination
65-71
dc.journal.pais
Francia
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dc.journal.ciudad
Paris
dc.description.fil
Fil: Li, Y..
dc.description.fil
Fil: Hällström, J.. Helsinki University Of Technology; Finlandia
dc.description.fil
Fil: Larzelere, W..
dc.description.fil
Fil: Bergman, A..
dc.description.fil
Fil: Rickmann, J..
dc.description.fil
Fil: Hauschild, W..
dc.description.fil
Fil: Diaz, Ricardo Ruben. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Tucumán; Argentina
dc.description.fil
Fil: Garnacho, F..
dc.description.fil
Fil: McComb, T..
dc.description.fil
Fil: Okabe, S..
dc.description.fil
Fil: Zhang, Y. X..
dc.description.fil
Fil: Elg, Alf Peter.
dc.journal.title
Electra
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dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://www.e-cigre.org/Order/select.asp?ID=1705172
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