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dc.contributor.author
Li, Y.  
dc.contributor.author
Hällström, J.  
dc.contributor.author
Larzelere, W.  
dc.contributor.author
Bergman, A.  
dc.contributor.author
Rickmann, J.  
dc.contributor.author
Hauschild, W.  
dc.contributor.author
Diaz, Ricardo Ruben  
dc.contributor.author
Garnacho, F.  
dc.contributor.author
McComb, T.  
dc.contributor.author
Okabe, S.  
dc.contributor.author
Zhang, Y. X.  
dc.contributor.author
Elg, Alf Peter  
dc.date.available
2016-08-22T14:32:57Z  
dc.date.issued
2014-08  
dc.identifier.citation
Li, Y.; Hällström, J.; Larzelere, W.; Bergman, A.; Rickmann, J.; et al.; Past, Present and Future of IEC and IEEE High-Voltage Testing Standards; International Council on Large Electric Systems; Electra; 276; 8-2014; 65-71  
dc.identifier.issn
1519-793X  
dc.identifier.uri
http://hdl.handle.net/11336/7261  
dc.description.abstract
Recently, IEC and IEEE have published a number of revised and new standards for high-voltage and high-current testing. These standards include IEC 60060 1:2010, IEC 60060 2:2010, IEC 61083 2:2013, IEC 62475:2010 and IEEE Std.4 2013. Significant changes and additions have been introduced to these revised and new standards. Many members of CIGRE WG D1.35 were involved in the revision and development of these standards as members of IEC TC 42 and IEEE PSIM Subcommittee HVTT, particularly in the development of the new techniques and new procedures that are now adopted in the standards. This Guide has been written by members of CIGRE WG D1.35 to give high-voltage test engineers a broader knowledge of how to apply the latest high-voltage and high-current testing standards.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
International Council on Large Electric Systems  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
High Voltage  
dc.subject
High Current  
dc.subject
Measurement  
dc.subject
Standard  
dc.subject.classification
Ingeniería Eléctrica y Electrónica  
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Past, Present and Future of IEC and IEEE High-Voltage Testing Standards  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2016-08-17T15:40:09Z  
dc.journal.volume
276  
dc.journal.pagination
65-71  
dc.journal.pais
Francia  
dc.journal.ciudad
Paris  
dc.description.fil
Fil: Li, Y..  
dc.description.fil
Fil: Hällström, J.. Helsinki University Of Technology; Finlandia  
dc.description.fil
Fil: Larzelere, W..  
dc.description.fil
Fil: Bergman, A..  
dc.description.fil
Fil: Rickmann, J..  
dc.description.fil
Fil: Hauschild, W..  
dc.description.fil
Fil: Diaz, Ricardo Ruben. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Tucumán; Argentina  
dc.description.fil
Fil: Garnacho, F..  
dc.description.fil
Fil: McComb, T..  
dc.description.fil
Fil: Okabe, S..  
dc.description.fil
Fil: Zhang, Y. X..  
dc.description.fil
Fil: Elg, Alf Peter.  
dc.journal.title
Electra  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://www.e-cigre.org/Order/select.asp?ID=1705172