Artículo
Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
Seré, Pablo Ricardo; Zerbino, Jorge Omar; Maltz, Alberto Leonardo; Deya, Marta Cecilia
; Elsner, Cecilia Ines
; Di Sarli, Alejandro Ramón
Fecha de publicación:
02/2016
Editorial:
Global Scientific Inc.
Revista:
ChemXpress
ISSN:
2320-1967
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
Films of gmercap to propyltri methoxysilane are prepared by hydrolysis, condensation and curing at 80 oC. The optical indices, n, k and the thickness d are calculated using the ellipsometry technique.Aprogramme is developed to fit a wide set of ellipsometricï andï data in the visible optical region 400 nm < ë < 600 nm. An increase in the optical absorption k is detected for the lower concentration ofMPTMS attributed to light absorption from the pores.
Palabras clave:
Silane
,
Anticorrosive
,
Ellipsometry
,
Optical
Archivos asociados
Licencia
Identificadores
Colecciones
Articulos(CIDEPINT)
Articulos de CENTRO DE INV EN TECNOLOGIA DE PINTURAS (I)
Articulos de CENTRO DE INV EN TECNOLOGIA DE PINTURAS (I)
Citación
Seré, Pablo Ricardo; Zerbino, Jorge Omar; Maltz, Alberto Leonardo; Deya, Marta Cecilia; Elsner, Cecilia Ines; et al.; Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles; Global Scientific Inc.; ChemXpress; 9; 2; 2-2016; 109-118
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