Artículo

Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles

Seré, Pablo Ricardo; Zerbino, Jorge Omar; Maltz, Alberto Leonardo; Deya, Marta CeciliaIcon ; Elsner, Cecilia InesIcon ; Di Sarli, Alejandro Ramón
Fecha de publicación: 02/2016
Editorial: Global Scientific Inc.
Revista: ChemXpress
ISSN: 2320-1967
Idioma: Inglés
Tipo de recurso: Artículo publicado
Clasificación temática:

Resumen

Films of gmercap to propyltri methoxysilane are prepared by hydrolysis, condensation and curing at 80 oC. The optical indices, n, k and the thickness d are calculated using the ellipsometry technique.Aprogramme is developed to fit a wide set of ellipsometricï andï data in the visible optical region 400 nm < ë < 600 nm. An increase in the optical absorption k is detected for the lower concentration ofMPTMS attributed to light absorption from the pores.
Palabras clave: Silane , Anticorrosive , Ellipsometry , Optical
 
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info:eu-repo/semantics/openAccess Excepto donde se diga explícitamente, este item se publica bajo la siguiente descripción: Creative Commons Attribution-NonCommercial-ShareAlike 2.5 Unported (CC BY-NC-SA 2.5)
Identificadores
URI: http://hdl.handle.net/11336/49359
URL: http://www.tsijournals.com/abstract/study-of-silane-layers-grown-on-steel-and-ch
Colecciones
Articulos(CIDEPINT)
Articulos de CENTRO DE INV EN TECNOLOGIA DE PINTURAS (I)
Citación
Seré, Pablo Ricardo; Zerbino, Jorge Omar; Maltz, Alberto Leonardo; Deya, Marta Cecilia; Elsner, Cecilia Ines; et al.; Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles; Global Scientific Inc.; ChemXpress; 9; 2; 2-2016; 109-118
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